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1 个结果
  • 简介:Thedegradationmechanismofenhancement-modeAlGaN/GaNhighelectronmobilitytransistors(HEMTs)fabricatedbyfluorineplasmaionimplantationtechnologyisonemajorconcernofHEMT’sreliability.Itisobservedthatthethresholdvoltageshowsasignificantnegativeshiftduringthetypicallong-termon-stategateoverdrivestress.Thedegradationdoesnotoriginatefromthepresenceofas-growntrapsintheAlGaNbarrierlayerorthegeneratedtrapsduringfluorineionimplantationprocess.Bycomparingtherelationshipsbetweentheshiftofthresholdvoltageandthecumulativeinjectedelectronsunderdifferentstressconditions,agoodagreementisobserved.Itprovidesdirectexperimentalevidencetosupporttheimpactionizationphysicalmodel,inwhichthedegradationofE-modeHEMTsundergateoverdrivestresscanbeexplainedbytheionizationoffluorineionsintheAlGaNbarrierlayerbyelectronsinjectedfrom2DEGchannel.Furthermore,ourresultsshowthattherearefewnewtrapsgeneratedintheAlGaNbarrierlayerduringthegateoverdrivestress,andtheionizedfluorineionscannotrecapturetheelectrons.

  • 标签: HEMT器件 离子注入技术 降解机理 氟离子 ALGAN 动应力