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《核工业西南物理研究院年报:英文版》
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2005年1期
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Development of Electron Temperature Measuring System by Silicon Drift Detector
Development of Electron Temperature Measuring System by Silicon Drift Detector
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摘要
未填写
DOI
kd2nr3zpd6/477638
作者
SONG Xianying YANG Jinwei LIAO Min LI Xu ZHANG Yipo FUBingzhong LUO Cuiwen
机构地区
不详
出处
《核工业西南物理研究院年报:英文版》
2005年1期
关键词
软X射线光谱学
硅漂移探测器
电子温度
微小测量误差
分类
[理学][物理]
出版日期
2005年01月11日(中国期刊网平台首次上网日期,不代表论文的发表时间)
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来源期刊
核工业西南物理研究院年报:英文版
2005年1期
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相关关键词
软X射线光谱学
硅漂移探测器
电子温度
微小测量误差
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