摘要
Detectionofpathdelayfaultsrequirestwo-patterntests.BISTtechniqueprovidesalow-costtestsolution.Thispaperproposesanapproachtodesigningacost-effectivedeterministictestpatterngenerator(IPG)forpathdelaytesting.Givenasetofpre-generatedtest-patterngenerator(TPG)forpathdelaytesting.Givenasetofpre-generatedtest-pairswithpre-determinedfaultcoverage,adeterministicTPGissynthesizedtoapplythegiventest-pairsetinalimitedtesttime.Toachievethisobjective,configuablelinearfeedbackshiftregister(LFSR)structuresareused.TechniquesaredevelopedtosynthesizesuchaTPG.whichisusedtogenerateanunordereddeterministictest-pairset.TheresultingTPGisveryefficientintermsofhardwaresizeandspeedperformance.SImulationofacademicbenchmarkcircuitshasgivengoodresultswhencomparedtoalternativesolutions.
出版日期
2000年05月15日（中国期刊网平台首次上网日期，不代表论文的发表时间）
