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Probing defects in ZnO by persistent phosphorescence
Probing defects in ZnO by persistent phosphorescence
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摘要
未填写
DOI
2d3w7918j9/1868591
作者
Honggang Ye;Zhicheng Su;Fei Tang;Yitian Bao;Xiangzhou Lao;Guangde Chen;Jian Wang;Shijie Xu
机构地区
不详
出处
《光电进展(英文)》
2018年6期
关键词
分类
[电子电信][物理电子学]
出版日期
2018年06月16日(中国期刊网平台首次上网日期,不代表论文的发表时间)
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来源期刊
光电进展(英文)
2018年6期
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